Research Publications for Jonathan B Scott

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Author's Publications

Publications BySCOTT, Jonathan B

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  • Khoo, E., & Scott, J. (2018). The flipped classroom. In Professional Development Workshops for the Lecturers from Hebei Univerity of Science and Technology (HHEBUST)University of Waikato, Hamilton, New Zealand.

  • Hasan, R., & Scott, J. B. (2018). Letter to the Editor Re “Fractional Modeling and SOC Estimation of Lithium-ion Battery”. IEEE Caa Journal of Automatica Sinica, 5(2), 644.

  • Mccabe, S., & Scott, J. B. (2017). Implant Conductor assembly with improved Radio Frequency properties. [Invention]. https://patents.google.com/patent/WO2017086805A1/en.

  • Hartung, D., Scott, J. B., McCabe, S., & Single, P. (2017). MRI Safe Electrodes for Spinal Cord Stimulation (SCS). In 13th World Congress of the International Neuromodulation Society. Conference held at Edinburgh, Scotland.

  • Seshadri, S., & Scott, J. B. (2017). Enhancing skin-effect using surface roughening and its potential to reduce RF heating from implant leads. In Proceedings of the Electronics New Zealand Conference 2017. Conference held at Christchurch, New Zealand.

  • Peter, M., Khoo, E. G. L., Cowie, B., Scott, J., & Round, H. (2017). Reengineering an engineering course: How flipped classrooms afford transformative teaching, learning, and workplace competency: Reengineering an engineering course: How flipped classrooms afford transformative teaching, learning, and workplace competency. Teaching & Learning Research Initiative. Retrieved from http://www.tlri.org.nz/

  • McCabe, S., & Scott, J. B. (2017). A Novel Implant Electrode Design Safe in the RF Field of MRI Scanners. IEEE Transactions on Microwave Theory and Techniques, PP(99), 1-7. doi:10.1109/TMTT.2017.2669977

  • Kelly, C., & Scott, J. B. (2017). The coffee roaster's paradox. In Proceedings of the Electronics New Zealand Conference 2017. Conference held at Christchurch, New Zealand: ENZCon.org.

  • Macdonell, M., & Scott, J. B. (2017). Development and basic calibration of an acoustic vector network analyser. In Proceedings of the Electronics New Zealand Conference 2017. Conference held at Christchurch, New Zealand: Enzcon.org.

  • Dao, N. C., Kass, A. E., Azghadi, M. R., Jin, C. T., Scott, J., & Leong, P. H. W. (2017). An enhanced MOSFET threshold voltage model for the 6–300 K temperature range. Microelectronics Reliability, 69, 36-39. doi:10.1016/j.microrel.2016.12.007

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