Research Publications for Jonathan B Scott

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Publications BySCOTT, Jonathan B

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  • Dao, N. C., Kass, A. E., Azghadi, M. R., Jin, C. T., Scott, J., & Leong, P. H. W. (2017). An enhanced MOSFET threshold voltage model for the 6–300 K temperature range. Microelectronics Reliability, 69, 36-39. doi:10.1016/j.microrel.2016.12.007

  • Hartung, D., Scott, J. B., McCabe, S., & Single, P. (2017). MRI Safe Electrodes for Spinal Cord Stimulation (SCS). In 13th World Congress of the International Neuromodulation Society. Conference held at Edinburgh, Scotland.

  • Macdonell, M., & Scott, J. B. (2017). Development and basic calibration of an acoustic vector network analyser. In Proceedings of the Electronics New Zealand Conference 2017. Conference held at Christchurch, New Zealand: Enzcon.org.

  • McCabe, S., & Scott, J. B. (2017). A Novel Implant Electrode Design Safe in the RF Field of MRI Scanners. IEEE Transactions on Microwave Theory and Techniques, PP(99), 1-7. doi:10.1109/TMTT.2017.2669977

  • Kelly, C., & Scott, J. B. (2017). The coffee roaster's paradox. In Proceedings of the Electronics New Zealand Conference 2017. Conference held at Christchurch, New Zealand: ENZCon.org.

  • Seshadri, S., & Scott, J. B. (2017). Enhancing skin-effect using surface roughening and its potential to reduce RF heating from implant leads. In Proceedings of the Electronics New Zealand Conference 2017. Conference held at Christchurch, New Zealand.

  • Mohri, H., & Scott, J. B. (2017). Cross-needle analog meter to monitor charge time for lithium-ion single cell. In B. Bonnett, & M. Hayes (Eds.), Proceedings of Electronics New Zealand Conference 2017. Conference held at Christchurch, New Zealand: enzcon.org.

  • Kelly, C., & Scott, J. B. (2016). Microwave Aquametry of Roasting Coffee Beans. In Asia-Pacific Microwave Conference (APMC). Nanjing, China: IEEE. doi:10.1109/APMC.2015.7413412

  • Mulder, J., & Scott, J. (2016). The measurement of knife sharpness and the impact of sharpening technique on edge durability: The Measurement of Knife Sharpness and the Impact of Sharpening Technique on Edge Durability.

  • Hasan, R., & Scott, J. B. (2016). Fractional behaviour of rechargeable batteries. In Proceedings of the 2016 Electronics New Zealand Conference (pp. 111-114). Victoria University of Wellington, New Zealand.

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