Research Publications for Jonathan B Scott
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Dao, N. C., Kass, A. E., Azghadi, M. R., Jin, C. T., Scott, J., & Leong, P. H. W. (2017). An enhanced MOSFET threshold voltage model for the 6–300 K temperature range. Microelectronics Reliability, 69, 36-39. doi:10.1016/j.microrel.2016.12.007
Hartung, D., Scott, J. B., McCabe, S., & Single, P. (2017). MRI Safe Electrodes for Spinal Cord Stimulation (SCS). In 13th World Congress of the International Neuromodulation Society. Conference held at Edinburgh, Scotland.
McCabe, S., & Scott, J. B. (2017). A Novel Implant Electrode Design Safe in the RF Field of MRI Scanners. IEEE Transactions on Microwave Theory and Techniques, PP(99), 1-7. doi:10.1109/TMTT.2017.2669977
Hutchins, M., & Scott, J. B. (2016). Speed control of small motors through the Cuk Converter Topology. In Proceedings of the 22nd Electronics New Zealand Conference. Victoria University of Wellington.
Scott, J., Khoo, E., Peter, M., & Round, H. (2016). Flipped classroom learning in a large introductory undergraduate engineering course. In AAEE2016 Conference. Conference held at Novotel Pacific Bay Resort, Coffs Harbour, Australia.
Hasan, R., & Scott, J. (2016). Application of Swingler's Method for analysis of multicomponent exponentials with special attention to non-equispaced data. In Proceeding - 2016 IEEE 12th International Colloquium on Signal Processing and its Applications, CSPA 2016 (pp. 12-15). Melaka, MALAYSIA: IEEE. doi:10.1109/CSPA.2016.7515794
McCabe, S. O., & Scott, J. B. (2016). New MRI-safe implant electrode design. In IEEE MTT-S International Microwave Symposium Digest Vol. 2016-August. doi:10.1109/MWSYM.2016.7540205
Mulder, J., & Scott, J. (2016). The measurement of knife sharpness and the impact of sharpening technique on edge durability: The Measurement of Knife Sharpness and the Impact of Sharpening Technique on Edge Durability.
Peter, M., Khoo, E. G. L., Scott, J., & Round, H. (2016). Learning threshold concepts in an undergraduate engineering flipped classroom. In N. Wright (Ed.), DEANZ2016 There and back: Charting flexible pathways in open, mobile and distance education (pp. 111-115). University of Waikato, Hamilton, New Zealand: DEANZ.
Kelly, C., & Scott, J. B. (2016). Microwave Aquametry of Roasting Coffee Beans. In Asia-Pacific Microwave Conference (APMC). Nanjing, China: IEEE. doi:10.1109/APMC.2015.7413412