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(ENGEE232 and ENGEE233) or (ENEL205 and ENEL211)


The paper covers techniques for fabricating ICs, CMOS devices, logic gate characteristics and design, monolithic topologies such as differential pairs, multipliers, current mirrors, bandgap references, opamps, device failure mechanisms, ESD, electromigration, and estimating circuit reliability.

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  • Paper details current as of 1 Jun 2024 18:50pm
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